By Richard H. Vollmerhausen
Advancing know-how in detector arrays, flat panel monitors, and electronic photograph processing offers new possibilities to extend imaging functions and improve approach functionality. Technical managers and layout engineers are confronted with comparing the price, weight, and function of an ever-expanding collection of know-how suggestions. This educational textual content presents the speculation, strategies, and data essential to evaluation and examine the functionality of accessible imaging applied sciences. half I updates the sooner paintings awarded in research of Sampled Imaging platforms (2000). half II discusses functionality evaluate of electro-optical imagers. half III presents machine courses (on a supplemental CD-ROM) and updated details on detector arrays, optics, and exhibit techniques. The publication covers a number of demonstrate codecs and interfaces, and gives distinct info on to be had focal aircraft arrays (FPAs). specific emphasis is put on thought and perform for the big variety of obtainable infrared FPAs. applied sciences represented contain InSb, HgCdTe, QWIP, and uncooled thermal arrays. details is equipped at the quantum potency, blur, crosstalk, and noise features of every expertise. The detector and array dimensions of accessible FPAs are supplied. the data on optics, reveal, and FPA subassemblies permits the version consumer to make fast and real looking functionality tests of electro-optical imager designs.
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Additional info for Analysis and Evaluation of Sampled Imaging Systems (SPIE Tutorial Text Vol. TT87) (SPIE Tutorial Texts)
This example used only two samples. In the general case, sinc waves are generated for all samples, and the sum of all sinc waves is the reconstructed waveform. wave amplitude is equal to the sample value, and the period is such that the sinc wave crosses zero at all other sample points. The function f(x) is sampled over all space, and each sinc wave extends in both directions over all space. 2 Example If a sine wave is infinitely extended, then the Fourier transform is a delta function at the sine-wave frequency.
The function f(x) is a specific function in image space. The samples of f(x) are taken anywhere in space. As sample phase or position varies, the function f(x) does not change; only where it is sampled changes. 14) is rewritten to explicitly permit the function f(x) to be located anywhere in sample space. This is done by letting f(x) be offset in space by a distance x. The origin at x = 0 is still a sample point: The Sampling Process 21 g ( x) N 1 f ( x x) ( x nX ) r ( x). 17) n0 The Fourier transform is taken before the delta functions multiply f(x).
1000 ξ 2 η2 cycles per radian. 2 2 1 χλ χλ χλ χλ H diff (ξ,η) cos 1 for 1. D π D D D χλ 1. 16 shows diffraction MTF Hblock versus radial frequency for circular apertures with circular blockages. 16 MTF of circular apertures that are partially blocked by circular obstructions. 5 the diameter of the aperture. The abscissa is a fraction of the diffraction cutoff. The plots represent MTF versus radial frequency. cutoff frequency, and the ordinate is MTF.